DHM®     DIGITAL HOLOGRAPHIC MICROSCOPY
 
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Specifications
R2200 series
R2100 series
 
R1100 series
R1000 series
 
T1000 series
 
 
Koala Software
Objectives
 
Stroboscopic module
 
 
 
 
 

R1000 series


System  
Measurement technique: single wavelength digital holographic microscopy in reflection
Image types: intensity and quantitative phase contrast image (DHM mode)
Light source: monochromatic laser source
Sample stage: manual or automated XYZ stages up to 150 mm × 150 mm × 12.5 mm travel range
Camera: 1392 x 1040 pixel, 8 bits
Available objectives: standard, high NA, long working distance, water/oil immersion microscope objectives
Objective mounting: 4-position turret
Computer: Dell workstation with latest Intel ® processor, optimized and configured for DHM, with 19” SXGA monitor
Software: Lyncée Tec proprietary Koala classic software based on a C++ and .NET
   
Performance  
Accuracy 1 : 0.1 nm
Vertical resolution 2 : 0.2 nm
Repeatability 3 : < 0.01 nm
Vertical calibration: determined by the wavelength, no mechanical movement calibration
Vertical measuring range: up to depth of field for smooth samples, up to 340 nm for sharp edge samples
Lateral resolution: objective dependent, down to 300 nm with oil immersion objectives (1.4 NA)
Field of view: objective dependent up to 4.4 mm
Working distance: objective dependent from 0.3 mm to 18 mm
Digital focusing range: up to 50× depth of field (objective dependent)
Grabbing time (1 hologram): down to 1 µs in a single image grab (no scanning mechanism, insensitive to vibrations)
Spatial sampling: 1024 x 1024 pixels (hologram)
Acquisition rate: 15 fps (1024 × 1024 pixels) (optional up to 300 fps)
Reconstruction rate: 15 fps (512 × 512 pixels), 4 fps (1024 × 1024 pixels)
Min. sample reflectivity: less than 1%
Sample illumination: down to 1 µW/cm2
Maximum sample size: L × W: 8 × 415 mm
   
Power requirements  
Input voltage: 85-260 VAC - 50/60 Hz
Power requirements (w/o computer): max 480 W
   
Dimensions & weight  
Dimensions (L × W × H): 600 × 600 × 800 mm
Weight: 45 kg

Specifications are subject to change without notice

1   As demonstrated by taking the temporal standard deviation on 1 pixel over 30 measurements*.
2   Defined as twice the accuracy.
3   As demonstrated by taking the one sigma Rq value of 30 repeatability measurements* on SiC reference mirror.
*  1 measurement is the average of 10 acquisitions.