Live and robust nanometer optical topography

The reflection configured DHMs' are ideal for totally and partially reflecting objects. Their ability to work with low reflective interfaces (down to less than 1% reflectivity), make them ideal tools for accurate optical topography measurements on a large variety of samples.

Thanks to its high acquisition rate and ease of use, DHM allows rapid routine inspections, automated industrial quality control as well as R&D applications, particularly for dynamic observations.

DHM R2200 series - 3 wavelengths
15 micron vertical range at 15 measurements per second
The R2200 series reaches a new level for real-time measurements in interference microscopy. Three light sources allow two different simultaneous dual wavelengths for real-time measurements over the largest vertical range in optical interference microscopy. Mapping algorithms ensure to keep the monochromatic sub-nanometer resolution over the complete vertical measurement range. Optional vertical coherence scanning increases the measurement range to several millimeters.

DHM R2100 series - simultaneous dual wavelength
3 microns vertical steps with nanometer resolution
The R2100 series is made of cost-effective instruments providing simultaneous dual wavelength measurements. The two includes sources allow a synthetic wavelength that allow real-time measurements of 3 microns high steps with a sub-nanometer resolution. Optional vertical coherence scanning increases the measurement range to several millimeters.

DHM R1100 series - alternate dual wavelength
Extend the monochromatic vertical measurement range
The R1100 series not only allows real-time measurements with sub-nanometer resolution, but also permits the characterization of samples that exceed the monochromatic vertical measurement range. Alternate dual wavelength and vertical scanning extend the range to several millimeters.

DHM R1000 series - single wavelength DHM
Cost-effective sub-nanometer resolution in real-time
The R1000 series are cost-effective instruments providing real-time measurements of samples with sub-nanometer resolution for step heights up to 340 nm. It can be upgraded to R1100 series to meet any budget requirements.

Custom
DHM adapted to your needs
DHM reflection configured instruments can easily be adapted to your environment, as for example on a probe station.